Design - For - Testability, DFT has become a very important part of the CMOS chip and system design.
可測(cè)試性設(shè)計(jì)(Design-For-Testability, DFT)已經(jīng)成為芯片或系統(tǒng)設(shè)計(jì)中不可或缺的重要組成部分.
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First, this paper introduces the conception of software test , testability andtestability.
本文針對(duì)軟件可測(cè)試性的量化檢測(cè)給出了一套完整的解決方案.
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Does this invisible complexity affect the function's reliability and testability?
這種暗藏的復(fù)雜性會(huì)影響函數(shù)的可靠性和可測(cè)性 嗎 ?
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The methodologies of design for testability ( DFT ) are widely realized in the digital circuits test.
可測(cè)性設(shè)計(jì) ( DFT ) 方法廣泛應(yīng)用于數(shù)字電路測(cè)試中.通過添加測(cè)試硬件,用來降低測(cè)試的復(fù)雜性.
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The method is applied to testability analysis in nonlinear analog circuit an illustration validated this method.
最后將該方法運(yùn)用于非線性模擬電路的可測(cè)性問題分析.
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Its structure is derived from the analysis of the software testability concept by analytical hierarchy process.
分析軟件測(cè)試性概念,使用層次分析法得到新的框架結(jié)構(gòu).
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The first step of design for testability ( DFT ) is to determine the testability index.
合理地提出系統(tǒng)測(cè)試性指標(biāo)是測(cè)試性設(shè)計(jì)的首要步驟.
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Design for testability is critical for airborne computer, a kind of embedded computer used in aircraft.
安裝在飛機(jī)上的嵌入式計(jì)算機(jī),稱為機(jī)載計(jì)算機(jī), 它的可測(cè)試性設(shè)計(jì)是整個(gè)設(shè)計(jì)中的非常重要的方面.
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Diagnostic strategy design is an important task in the design for testability ( DFT ).
診斷策略優(yōu)化設(shè)計(jì)是測(cè)試性設(shè)計(jì)中的一項(xiàng)重要內(nèi)容.
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In my experience, this is a major problem, reducing testability and object orientation.
以我的經(jīng)驗(yàn), 這是減少可測(cè)試性和對(duì)象定位的主要問題.
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