With the number of dots in the screen becoming larger,the period of writing data into OLED is certainly becoming longer.
在協(xié)調(diào)數(shù)據(jù)的寫(xiě)入和讀取方式上,提出了一種雙節(jié)拍模式的控制驅(qū)動(dòng)方法,即外設(shè)RAM設(shè)立雙套模式,兩套R(shí)AM交替對(duì)數(shù)據(jù)進(jìn)行讀寫(xiě)操作,并且采用兩組驅(qū)動(dòng)芯片分奇偶列同時(shí)向屏寫(xiě)數(shù)據(jù)。
The relation between threshold voltage and writing time,programming voltage,tunnel area and floating area is simulated.
介紹了 EEPROM的電學(xué)模型 ,模擬分析了閾值電壓變化與寫(xiě)入時(shí)間、寫(xiě)入電壓、隧道孔面積、浮柵面積的關(guān)系 。
Experimentally,diffraction efficiency of photon crystal lattice was measured in different read-in angle.
測(cè)定了雙光束耦合時(shí)不同入射角度光子晶格的衍射效率,實(shí)驗(yàn)曲線表明,衍射效率隨寫(xiě)入角度(光子晶格周期)的變化也有極大值存在,并且與數(shù)值模擬所對(duì)應(yīng)的角度是吻合的。
The examination,parameter read-in and the unit calibration of the combined meter board were implemented,suiting for kinds of digital instrument.
論述了系統(tǒng)設(shè)計(jì)中的幾個(gè)主要模塊,實(shí)現(xiàn)了組合儀表總成校驗(yàn)、參數(shù)寫(xiě)入及電路板檢測(cè),該系統(tǒng)適合各類(lèi)數(shù)字儀表檢測(cè)。